SNU PRECISION
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Core Technology

The advanced technology of SNU Precision is opening the future.

Product introduction

CDMS

CDMS

Introduction Various line width measurement in LCD process
Features Non-contact line width measurement
Nano-level resolution, high-speed measurement
3D CD measurement available with 3D lens
Measurement Item: Overlay, Hole, PR, Metal, ITO Slit CD Measurement
Application TFT Photo process, TFT PECVD process, and other fields requiring high precision second-dimensional surface CD measurement